ULTRA TEC introduces the first microscopy system designed with the sample preparation professional in mind.

ICis allows for fast, convenient imaging in the sample preparation laboratory. Validation of sample preparation and remaining silicon thickness can be obtained without moving the sample to an emission or other backside microscope.

ICis reaches maximum functionality when used with ULTRA TEC's sample preparation systems such as ULTRAPOL Advance and ASAP-1 Selected Area Preparation System -- The sample mounting plate (pictured below) can be conveniently transferred between ICis, ARC-lite and ASAP-1

IMAGING MODES

Resources

>> Datasheet - coming soon!

>> ULTRASPEC III - Laser Illuminator

Product Highlights

  Software controls for fast high quality imaging in all modes

  Uses standard mounting plates from SAP products for ease of transfer between equipment

  Small footprint – can be positioned in sample prep lab for convenience

Focal Depth Measurement - accurate automated focus block allows for easy determination of remaining silicon thickness.